TY - JOUR A2 - Mantzavinos, Dionissios AU - Park, N. C. AU - Oh, W. W. AU - Kim, D. H. PY - 2013 DA - 2013/12/18 TI - Effect of Temperature and Humidity on the Degradation Rate of Multicrystalline Silicon Photovoltaic Module SP - 925280 VL - 2013 AB - In a PV module, the relative humidity (rh) of a front encapsulant is different from that of a backside encapsulant (rhback). In this study, the effective humidity (rheff) in a PV module was investigated to study the effects of moisture variation on the degradation rate (
R
D
). rheffrepresents uniform humidity in a PV module when it is exposed to certain damp heat conditions. Five types of accelerated tests were conducted to derive the relation between rheffand rhback. rheffshowed a linear relationship with rhbackat constant temperature. Two types of models, namely, Eyring and Peck models, were used for predicting the
R
D
of PV modules, and their results were compared. The
R
D
of PV modules was thermally activated at 0.49 eV. Furthermore, the temperature and rheffhistory of PV modules over one year were determined at two locations: Miami (FL, USA) and Phoenix (AZ, USA). The accumulated
R
D
values based on the temperature and rheffof the modules were calculated by summing the hourly degradation amounts over the time history. SN - 1110-662X UR - https://doi.org/10.1155/2013/925280 DO - 10.1155/2013/925280 JF - International Journal of Photoenergy PB - Hindawi Publishing Corporation KW - ER -